Rigaku Miniflex XRD

Rigaku Miniflex XRD

The Rigaku Miniflex II can be used for a variety of applications from diffraction pattern comparison of polycrystalline materials such as powder samples and metal plates to qualitative and quantitative analyses and quality management of raw materials and products. This Miniflex system also offers use of a real-time angle correction system, a single sample holder, an automated six sample changer (used in standard operation), as well as a monochromator addition that captures X-rays other than Cu Kα for use in analysis.

 

References:

1.D. M. Moore and R. C. Reynolds, Jr., X-Ray Diffraction and the Identification and Analysis of Clay Minerals, Oxford University Press, New York, Ch. 1, 2, & 3. 1989. (Plenum, New York, 1992).

2.M. F. C. Ladd and R. A. Palmer, Structure Determination by Crystallography, 3rd ed., Plenum Press, New York, 1994.

3.Jens Als-Nielsen and Des McMorrow, Elements of Modern X-ray Physics, John Wiley & Sons, Ltd., 2001

4.B. E. Warren, X-ray Diffraction, General Publishing Company, 1969, 1990 (Classic x-ray physics book)

5.B. D. Cullity, Elements of X-ray Diffraction, 2nd ed., Addison-Wesley, 1978 (Covers most techniques used in traditional material characterization)

6.D. Keith Bowen and Brian K. Tanner, High Resolution X-ray Diffractometry and Topography, Taylor & Francis, Ltd., 1998 (Semiconductors and thin film analysis)

7.H. Brumberger, Editor, Modern Aspects of Small-Angle Scattering, Kluwer Academic Publishers, 1993 (SAXS techniques)

8.Jan Drenth, Principles of Protein X-ray Crystallography, Springer, 1994 (Crystallography).

Rigaku Miniflex Operating Instructions