University of Delaware
Advanced Materials Characterization Lab | University of Delaware
Advanced Materials Characterization Lab | University of Delaware
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  • Equipment
    • Mass Spec & Chemical Analysis
      • Metrohm IC Pro
      • CNHS Elementar Analyzer
      • Agilent 7500 ICP/MS
      • Thermo Fisher ICAP/TQ
    • X-Ray Analysis
      • Rigaku Supermini 200 WDXRF
      • Bruker D8 XRD
      • Rigaku Ultima IV XRD
      • Xenocs SAXS/WAXS
      • Rigaku NANO 3DX CT Scanner
      • Rigaku GX 130 CT Scanner
    • Vibrational Spectroscopy
      • Anasys Nano IR2
      • FTIR/ATR
      • Kaiser Raman Spectrometer
      • Photothermal mIRage
      • neaSNOM Microscope
    • Porosity, Zeta Potential and Particle Size
      • Wyatt Mobius DLS Zeta Potential
      • Micromertics ASAP 2020 BET Analyzer
      • Beckman Coulter LS 13 320 Particle Size Analyzer
      • VCA Optima Contact Angle
      • Sigma 700 Surface Tension
    • Thermal Analysis
      • DTC-300
      • Q600 Simultaneous TGA-DSC
      • Discovery TGA
      • Discovery DSC
      • Q800 DMA
    • Equipment Pricing & Rates
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Contact Us

The Advanced Materials Characterization Laboratory

151 Interdisciplinary Science and Engineering Laboratory
221 Academy St., University of Delaware, Newark, Delaware 19716

302-831-6795
www.udel.edu/amcl

Useful Links

  • Core Facilities and Shared Resources Network
  • DBI Bio-Imaging Center
  • DENIN
  • W.M. Keck Microscopy Facility

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