The Ultima IV represents the state-of-the-art in multipurpose X-ray diffraction (XRD) systems. Incorporating Rigaku’s patented cross beam optics (CBO) technology for permanently mounted, permanently aligned and user-selectable parallel and focusing geometries, the Ultima IV X-ray diffractometer can perform many different measurements…fast. With a multipurpose diffractometer, performance is measured by not only how fast you perform an experiment but also how fast you can switch between different types of experiments. Individual experiments are optimized with accessories like the D/teX Ultra-high-speed position sensitive detector system, but the speed between experiments is radically improved with the combination of the automated alignment and CBO.
1.D. M. Moore and R. C. Reynolds, Jr., X-Ray Diffraction and the Identification and Analysis of Clay Minerals, Oxford University Press, New York, Ch. 1, 2, & 3. 1989. (Plenum, New York, 1992).
2.M. F. C. Ladd and R. A. Palmer, Structure Determination by Crystallography, 3rd ed., Plenum Press, New York, 1994.
3.Jens Als-Nielsen and Des McMorrow, Elements of Modern X-ray Physics, John Wiley & Sons, Ltd., 2001
4.B. E. Warren, X-ray Diffraction, General Publishing Company, 1969, 1990 (Classic x-ray physics book)
5.B. D. Cullity, Elements of X-ray Diffraction, 2nd ed., Addison-Wesley, 1978 (Covers most techniques used in traditional material characterization)
6.D. Keith Bowen and Brian K. Tanner, High Resolution X-ray Diffractometry and Topography, Taylor & Francis, Ltd., 1998 (Semiconductors and thin film analysis)
7.H. Brumberger, Editor, Modern Aspects of Small-Angle Scattering, Kluwer Academic Publishers, 1993 (SAXS techniques)
8.Jan Drenth, Principles of Protein X-ray Crystallography, Springer, 1994 (Crystallography).